IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And Test Rod
Brand Name:HongCe
Certification:calibration certificate(cost additional)
Model Number:HT-I01-I06
Minimum Order Quantity:1 set
Delivery Time:7 days
Payment Terms:T/T
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Location:
Guangzhou Guangdong China
Address:
No.6-39, Yaogu Farm, Shibi No.3 Village, Shibi Street, Panyu District, Guangzhou
Supplier`s last login times:
within 15 hours
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Product Details
IP Testing Equipment IP Test Probe Kit Jointed Test Finger and Test Rod
Application of IP Testing Equipment:
IP Test Probe Kit is a set of tools used to determine the degrees of protection provided by product enclosure against access to hazardous parts and ingress of solid foreign objects. It consists of access probes and object probes, which are required to be pushed against or inserted through any openings of the enclosure with the specified forces during testing. The access probes are used to simulate in a conventional manner a part of a person or a tool held by an operator to confirm whether there is sufficient clearance from hazardous parts. The object probes are applied to simulate solid foreign objects to confirm the possibility of ingress into an enclosure.
Feature of IP Testing Equipment:
IP test probes are made of insulating nylon material and stainless steel.
Each of the test probes is equipped with a wire and an alligator clip to connect to the hazardous parts inside the enclosure conveniently when testing on low-voltage equipment.
Included IP1X/2X/3X/4X Test Probes.
| Item | Parameter | Standard figure |
| IP1X test probe - 50.0 diameter sphere | Sphere diameter: 50 mm Guard diameter: 45 mm & guard thickness: 4 mm Handle length: 100 mm & handle diameter: 10 mm Required test force: 50 N ± 10 % | |
| IP2X access probe - Jointed test finger | Finger length: 80 mm and utmost diameter: 12 mm The finger consists of 2 joints able to be bent over an angle of up to 90° Stop face: 50 mm in diameter x 20 mm Required test force: 10 N ± 10 % | |
| IP2X object probe - 12.5 mm diameter sphere | Sphere diameter: 12.5 mm Guard diameter: 10 mm & guard thickness: 4 mm Handle length: 100 mm & handle diameter: 4 mm Required test force: 30 N ± 10 % | |
| IP3X test probe - Test rod | Rigid test rod length: 100 mm & rod diameter: 2.5 mm Stop face: 35 mm diameter sphere Handle length: 100 mm & handle diameter: 10 mm Required test force: 3 N ± 10 % | |
| IP4X test probe - Test wire | Rigid test wire length: 100 mm & wire diameter: 1.0 mm Stop face: 35 mm diameter sphere Handle length: 100 mm & handle diameter: 10 mm Required test force: 1 N ± 10 % |
IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And Test Rod
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