Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber
Brand Name:Haida
Model Number:HD-512-NAND
Minimum Order Quantity:1set
Delivery Time:30 Days After Order
Payment Terms:L/C, D/A, D/P, T/T, Western Union, MoneyGram
Place of Origin:China
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Location:
Dongguan Guangdong China
Address:
Room 105, Building F4, District F, Tianan Digital City, Nancheng District, Dongguan City, Guangdong Province,China
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within 37 hours
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Product Details
Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber
product Specification
Flash memory chip intelligent test system HD-512-NAND is a comprehensive flash memory test system that can customize the test plan and support parallel testing of various types of flash memory particles. 64 types, the maximum number of flash memory particles in parallel testing can reach 512.
Flash memory chip intelligent test system YC-512-NAND supports multiple test patterns and custom test parameter functions, and can provide one-click basic test process and high-level test process with high flexibility, not only can realize the remaining life of flash memory particles, actual measurement , data retention and read interference and other functional tests can also help users verify the reliability status of flash memory particles. After the test is completed, the test report can be easily and quickly exported with one key, providing customers with the most intuitive and accurate graphical test data. Provide the most intuitive data reference for the grade classification and application of flash memory particles, and realize intelligent classification based on the quality inspection results of flash memory particles.
※ The test basis complies with JEDEC Stand No.218: Solid State Technology Association B-2016 Solid-State Drive(SSD) Requirements And Endurance Test Motho;
※ The test basis complies with JEDEC Standard No.47 NVCE: Solid State Technology Association Stress-Test-Driven Qualification of Integrated Circuits;
※ The design specifications of the test board meet the requirements of the industrial-grade test temperature environment;
Information
| Inner box size | W760×D400×H890mm |
| Outer box size | W1870×D890×H1830mm |
| volume | 270L |
| Opening method | Single door (right open) |
| cooling method | air-cooled |
| weight | about 950KG |
| power supply | AC 380V About 7.5 KW |
Temperature Parameter
| temperature range | -70℃~150℃ |
| Temperature fluctuation | ≤±0.5℃ ≤±1℃ |
| temperature offset | ≤±2℃ |
| temperature resolution | 0.01℃ |
| Heating rate | 5℃/min(mechanical cooling, under standard load) |
| temperature change rate | High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear Adjustable (measured at the air outlet, mechanical cooling, under normal load) |
| temperature uniformity | ≤±2℃ |
| standard load | 10KG aluminum block, 500W load; |
Test Standard
GB/T5170.2-2008 Temperature test equipment GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB. GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA. GJBl50.3 (MIL-STD-810D) high temperature test method. GJBl50.4 (MIL-STD-810D) low temperature test method. |
Control System
| Display | Color LCD display |
| Operation mode | Program mode, fixed value mode |
| Setting | Chinese and English menu (optional), touch screen input |
| Setting range | Temperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C) |
display resolution | Temperature: 0.01°C Time: 0.01min |
control method | BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment) BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment) |
Curve record function | It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min) |
Accessory function | Fault alarm and cause, processing prompt function Power-off protection function Upper and lower limit temperature protection function Calendar timing function (automatic start and automatic stop operation) self-diagnosis function |
Comprehensive Flash Memory Test System High And Low Temperature Accelerated Aging Chamber
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