IEC60884-1 Figure 12 Test Apparatus for Deflection on Screwless Terminals

IEC60884-1 Figure 12 Test Apparatus for Deflection on Screwless Terminals

1. Introduction

The test apparatus for deflection on screwless terminals is to meet the test requirements of IEC60884-1 clause 12.3.12 and figure 12 for conducting deflection test to conductor connect with screwless terminals and testing the voltage drops. The test apparatus consists by deflecting device and voltage drop meter.

2. Specification

Pego Electronics is founded by PEGO GROUP in 2011, a professional high-tech enterprise engaged in developing, marketing and service for electronic test equipment. Our business scope includes IP testing equipment, dust chamber, pendulum and vertical impact testing equipment, flame test apparatus, glow wire test apparatus, needle flame tester, tracking index tester, iec61032 IP code probes, IEC60061-3 gauges for lamp caps and holders, UL498/VDE0620/BS1363-1 gauges for plug and socket, ground resistance tester, insulating resistance tester, hipot tester, temperature chamber, spring hammer, tumbling barrel test equipment, test vessels, ESD gun, surge generator, goniophotometer, integrating sphere, spectroradiometer, power supply and etc. Besides, we can provide customized service.

Nowadays, we have several production lines in China, we imported advance technology and machines to make the gauges to keep high precision, and use the world famous-brand components to make the equipment more reliable. We promise the customers can get the high quality products during the shortest lead time, and we can provide the third-lab calibration certificates if customer request. The Pego’s products have been sold to the world wide, and widely used in labs, production line, QC and R&D departments with the features of high precision, simple operation, humanization design and good performance.

To Provide better user experience with better quality and better price is the motto of Pego. With the growth of test items, PEGO hope to grow with our users, and search for better test solution for our users.