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During the detection process, it does not directly contact the
object under test, so it will not cause physical damage or
interference to the object under test, maximizing the integrity and
original performance of the tested components. For example, in the
detection of photovoltaic modules, it will not scratch the surface
of photovoltaic cells due to contact. It is very suitable for the
detection of some electronic devices with high requirements for
surface quality.
This detection method can also reduce the test errors caused by
contact, making the detection results more accurate and reliable
and truly reflecting the internal condition of the object under
test.
Product parameter | Data |
Shooting Mode | Direct Scanning Method (Modules front facing down, non-lifting type)Camera is fixed, component is moved for shooting |
Application Type | Before Lamination/After Lamination |
Modules Transfer Method | Module is transferred with the long side facing forward (transverse transfer) |
No. of Main Busbars | Main Busbar Compatibility:10-20BB |
Modules Placement Method | Flat |
Transfer Module Table Height | 950mm (±50mm) |
Modules Size | Length 1640-2300mm, Width 950-1300mm Regular/Double Glass + Half-cell (156-159 cells) |
Test Time | <22 s/pcs (shoot first, then judge) |
Camera Type | Non-cooling type industrial camera, with a 950nm filter added to the lens |
Beijing X-Solar Energy Co., Ltd. was found in 2020, and
headquartered in Beijing. It's a science and technology innovative
energy enterprises with the main business of future cell R&D,
flexible photovoltaic modules, building photovoltaic module
production, high-end equipment manufacturing, production line
delivery, and AI-CITY wisdom energy management services.
In July 2023, the company's first demonstration factory, Jiangsu
X-Solar Green-building Technology Co., Ltd., was established in
Jiangyin CNBM Jetion Industrial Park. Meanwhile, Jiangsu YuanTeng
FengSheng Intelligent Manufacturing Technology Co., Ltd., a
wholly-owned equipment company of the company, delivered the
world's first "three-in-one" automatic production line for Jiangyin
base. The production line can be compatible with the production of
three categories: X-Solar Light shadow series (flexible PV
modules), X-Solar Light rhyme series (building PVtile modules),
X-Solar Light Curtain series (building PV wall modules), and
customized products. X-Solar PV series products have the advantages
of integrating architectural aesthetics, complying with design
specifications and creating energy value, which have been widely
recognized and praised by customers in domestic and overseas.
In 2024, the company has added two regional centers in Shanghai and
Guangzhou of China, and set up the Hong Kong X-Solar Future Energy
Research Institute, and overseas sales companies in Australia,
Italy, Germany, Saudi Arabia and Argentina. The company has
launched a global layout to provide sustainable energy products and
services to many countries, and has contributed to the "carbon
neutrality and carbon peak".
I. Questions about the principle
Question: What is the working principle of the EL tester?
Answer: The EL tester mainly works based on the principle of
electroluminescence. When a forward bias voltage is applied to the
tested photovoltaic modules, semiconductor devices, etc., the
recombination of carriers inside them will release energy in the
form of light. The EL tester captures the emitted light through
high-sensitivity imaging devices such as cameras, and then analyzes
whether there are defects inside the tested objects and whether the
structure is normal according to the distribution and intensity of
the light.
Question: How does it detect internal defects?
Answer: It relies on detecting the uniformity and intensity changes
of the light signals generated by electroluminescence of the
objects. For example, when a normal solar cell emits light under
power supply, the overall light intensity distribution is
relatively uniform. If there are hidden cracks, false soldering and
other defects, the light intensity at the defect positions will
become weaker or there will be abnormal dark areas. The EL tester
can capture these changes in light signals and thus detect the
defects.
II. Questions about application scenarios
Question: In which fields are EL testers usually used?
Answer: They are mainly applied in the photovoltaic industry to
conduct quality inspections on solar cell modules and check for
problems such as hidden cracks, fragments, and broken grids. They
are also used in the semiconductor industry to detect the integrity
of the internal structure of semiconductor chips and other devices,
as well as the electron injection efficiency. Meanwhile, they are
also used in the inspection of LED lighting products to check
whether there are defective solder joints and other defects in LED
chips.
Question: What can the EL tester be used for at the photovoltaic
power station site?
Answer: At the photovoltaic power station site, a portable EL
tester can be used to quickly detect the installed photovoltaic
modules, check for faults such as hidden cracks and cell
desoldering that may occur during transportation, installation or
after long-term use, timely identify the faulty modules and arrange
for maintenance or replacement to ensure the power generation
efficiency and stable operation of the power station.
III. Questions about detection accuracy
Question: How high is the detection accuracy of the EL tester?
Answer: It can detect tiny hidden cracks at the micrometer level
and very subtle false soldering and other defects. Some internal
structural flaws that are difficult to be found by the naked eye or
even by conventional detection means can be detected through the
high-resolution imaging of the EL tester combined with precise
light signal analysis algorithms. Its accuracy is sufficient to
meet the requirements of most photovoltaic, semiconductor and other
related industries for component quality control.
Question: How to ensure the stability of the detection accuracy?
Answer: On the one hand, the optical imaging system of the tester
should be calibrated regularly to ensure that cameras and other
equipment can accurately capture light signals. On the other hand,
the testing environment should be kept relatively stable, such as
light conditions, temperature and humidity. At the same time, the
instrument should be operated in accordance with standard
specifications, and the internal data processing algorithms should
be updated and optimized regularly. All these help maintain the
stability of the detection accuracy.
IV. Questions about operation and use
Question: Is the operation of the EL tester complicated?
Answer: The operation of most EL testers is relatively simple.
There is an intuitive operation interface. Operators only need to
set corresponding basic test parameters such as voltage and current
according to the type and specification of the tested object, and
then start the test. The instrument can automatically conduct the
test and generate test images and results. Some portable ones can
even start the testing process with just one click.
Question: What should be paid attention to when using the EL tester
for the first time?
Answer: When using it for the first time, carefully read the user
manual to understand the basic functions of the instrument and the
functions of each component. Do a good job in the installation and
commissioning of the instrument, such as connecting the power cord
and data cable to ensure normal communication and power supply.
Also, perform simple initialization settings for the instrument,
such as setting the language and image display mode. It is best to
use standard test samples for testing practice first to familiarize
yourself with the operation process and result interpretation
methods.
V. Questions about maintenance
Question: How to maintain the EL tester on a daily basis?
Answer: Keep the surface of the instrument clean on a daily basis
to avoid dust and other substances from entering the optical
imaging system and affecting the detection effect. Regularly check
whether the cables of the instrument are damaged and whether the
connectors are loose. Use professional cleaning tools to wipe and
clean the lens of the imaging system in the correct way. Also,
regularly check the software version of the instrument and update
and upgrade it in time to obtain better performance and function
optimization.
Question: How to troubleshoot when the instrument fails?
Answer: First, check whether there is an error message prompt on
the instrument, and judge the general direction of the fault
according to the prompt. For example, if it prompts a power
failure, then check whether the power cord and power adapter are
working normally. If there is a problem with imaging, check the
camera lens, the image transmission line and the relevant image
acquisition software settings. If the software runs abnormally, try
restarting the instrument and the software. If the problem still
cannot be solved, contact the after-sales technical personnel of
the manufacturer for further troubleshooting and repair.
VI. Questions about the interpretation of test results
Question: How to understand the test images generated by the EL
tester?
Answer: Under normal circumstances, the light intensity
distribution in the image is uniform, and the color and brightness
are relatively consistent. If there are darker areas, striped or
blocky abnormal light and shadow, it may indicate that there are
defects at the corresponding positions. For example, dark lines may
indicate hidden cracks, and local dark blocks may indicate false
soldering or cell damage. At the same time, combine the relevant
labels and test data given by the instrument to comprehensively
judge the type and severity of the defects.
Question: What do the various parameters in the test results
represent?
Answer: The light intensity value reflects the light emission
intensity at the corresponding position. The light intensity
uniformity parameter reflects the uniformity of carrier
recombination and light emission inside the tested object. The
closer the value is to 1, the more uniform it is. There are also
parameters such as contrast that can help judge the difference
between the defective area and the normal area. Different
parameters help analyze the quality status of the tested object
from different aspects.