

Add to Cart
Test Equipment Power Test System Intelligent Equipment Tester For Charger High Voltage Automated Integration
Features of the Top-Smart 2000 ATE Power Supply Testing System:
Open
• An open hardware platform that allows for the addition or removal of various testing devices according to customer needs (including devices with GPIB, RS-232, USB interfaces, etc.)
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity.
• An open software platform, the ATE power supply testing system can be expanded with new test items and functions based on customer testing requirements.
• The ATE power supply testing system supports simultaneous multi-lane barcode pre-scanning and scanning during testing, enhancing overall testing speed.
Universal
• The ATE power supply testing system supports testing of various power supplies (LED power supplies, adapters/chargers, PC power supplies, inverters, communication power supplies, etc.)
• Complies with ENERGY STAR and IEC 62301 measurement requirements.
• Supports Manufacturing Information System (ShopFloor) interface.
• The ATE power supply testing system supports testing of various power parameters under CV, CC, CR, LED modes.
• Optimizes display mode, allowing for any combination of hardware configurations.
High-Speed
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity. (The testing speed for LED power supplies/adapters/chargers is more than double that of the widely used 6000 series power automatic systems.)
• Conducts parallel barcode scanning during testing, greatly improving testing speed.
Professional
• The ATE power supply testing system supports complete testing of LED driver power supplies.
• Can accurately read the average current and effective current of the tested LED driver.
• Easily starts low-power LED driver power supplies without pulling down the LED driver due to the high current surge from starting the electronic load.
• The ATE power supply testing system sets realistic LED on-threshold values and post-on operating point resistance through system settings, making the tested current and voltage waveforms very close to real LEDs.
• More realistic high-frequency current waveforms.
• Dimming function test: dimming current, dimming frequency, dimming period (requires additional related hardware devices).
1,erformance Optimization: During the research and development stage of the power supply, the ATE system can assist engineers in quickly and accurately measuring the performance parameters of the power supply and analyzing its performance bottlenecks, thereby facilitating targeted optimization design. For example, if the test reveals that the power supply's conversion efficiency is low, engineers can adjust the circuit topology and select appropriate components to improve the conversion efficiency.
2,Fault Analysis: When the power supply malfunctions or exhibits abnormal performance, the ATE system can help engineers quickly pinpoint the cause of the fault through detailed test data and analysis tools. This aids in shortening the development cycle, reducing costs, and enhancing the quality and reliability of the power supply.
3,Compatibility Testing: For power supplies that need to be used in conjunction with a variety of devices, such as adapters and chargers, the ATE system can conduct compatibility tests. It detects the degree of matching between the power supply and different devices and whether there are any compatibility issues, to ensure that the power supply can function normally in practical applications.
Top-Smart 2000 ATE Power Supply Testing System Test Items:
Test items | Comprehensive Test items |
CEC test | Short circuit test |
DC Current under C.V.Mode | Short circuit current |
Peak-Peak noise | OV protection |
Serial reaction time test | UV protection |
Transient response time | OL protection |
Transient spike | OP protection |
Tracking | In-test adjustment test |
Voltage regulation | AC cycle drop out |
Current regulation | PLD simulation |
Turn ON time | DC output current test |
Rise time | DC output voltage test |
Fall time | Waveform read test |
Hold-up time | Input impulse current test |
Inrush current test | Input power |
Power good signal | Relay control |
Power fail signal | Bar code scan |
P/S ON signal | Dynamic test |
Power up sequence | Specification under C.P.Mode |
Power off sequence | Input Peak current |
Effciency test | Additional expansion measurement test |
Overall stability test | Input RMS current |
Fan Speed test | TTL signal control |
Input power factor | LAN read/write |
Input voltage ramp | RS485 read/write |
Input freq. ramp | USB read/write |
Extend the measurement test | 232 read/write |
Automatic test | GPIB read/write |