400nm - 1100nm Wavelength Laser Instrument M2 Meter / M2 Factor Measurement System

Brand Name:Sintec Optronics
Model Number:STC Series
Delivery Time:Stock
Payment Terms:T/T via bank
Contact Now

Add to Cart

Verified Supplier
Location: Wuhan Hubei China
Address: Sintec Industrial Park, Optics Vally of China, Wuhan, Hubei Province, PR China
Supplier`s last login times: within 39 hours
Product Details Company Profile
Product Details

Wavelength 400-1100nm M² Meter / M² Factor Measurement System


Laser beam quality and its focusing capability are very important parameters of a laser and are usually characterized by M² factor. To measure the M² factor for a laser, it is calculated based on the difference between the product of the beam diameter and divergence, and the ideal Gaussian beam diffraction limit. The laser beam quality M2 is as below:

M2=(PI/4*LAMDA)*d0*THETA)

Where M2 is the laser beam quality M2, PI is 3.1415927, LAMDA is laser wavelength, d 0 is beam diameter, and THETA is divergence angle.

Part numberSTC-M2
Detector materialSi
Wavelength range400-1100nm
Receiving beam diameter20um-9mm
Testing output power range10nW-10W(Depends on the beam diameter)

The system comes with software. After the positions are keyed in the software, the beam diameters, beam divergence angle, and M2 will be calculated and given as shown as follows:

China 400nm - 1100nm Wavelength Laser Instrument M2 Meter / M2 Factor Measurement System supplier

400nm - 1100nm Wavelength Laser Instrument M2 Meter / M2 Factor Measurement System

Inquiry Cart 0