Non Ferrous Probe Film Thickness Tester With Limit Setting Function
Brand Name:LEEB
Certification:CE, FCC & ISO
Model Number:Leeb252A
Minimum Order Quantity:1 Set
Delivery Time:In 7-10 work days
Payment Terms:T/T, PayPal, Western Union, L/C
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Location:
Chongqing Chongqing China
Address:
High&New Technology Industrial Park, Yubei District, Chongqing, China
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Product Details
Non Ferrous Probe Film Thickness Tester With Limit Setting Function
Changeable Ferrous And Non-Ferrous Probe Plastic Shell Coating Thickness Gauge With Limit Setting Function
Functions & Features
● High quality metal probes.
● Two measuring methods:continuous and single;
● Two working mode: direct and batch;
● Limit setting function.
● Switch off automatically or manually.
Measuring Materials
Eddy Current (NFe): Measuring the thickness of Non-conductive
coating on non-magnetic metal substrate, such as rubber, plastic,
paint, oxide on the base of aluminum, copper, zinc, tin.
Technical Parameters
| Technical Parameters | ||||||||
| Model No. | Leeb252A | |||||||
| Measuring principle | Fe or NFe | |||||||
| Measuring range (µm) | 0~1250μm | |||||||
| Probe | Changeable | |||||||
| Shell | Plastic | |||||||
| Accuracy | ±(1~3%H+1) μm; H refers to the thickness of testing piece | |||||||
| Minimum resolution (µm) | 0.1μm | |||||||
| Min curvature of the min area (mm) | Convex1.5 Concave9 | |||||||
| Diameter of the min area (mm) | Φ7 | |||||||
| Critical thickness of substrate (mm) | 0.5 | |||||||
| Memory | 200 groups measured data | |||||||
| Dimensions | 115*55*23mm | |||||||
| Power supply | AAA Alkaline battery | |||||||
| Standard Configuration | Main unit,1 probe & substrate 5 calibration specimens (48.5μm,99.8μm,249μm,513μm 1024μm), | |||||||
| Optional Accessories | Probes,Specimens,1 leather sheath | |||||||
Measuring Conditions
a) The characteristics of substrate
Standard methods for magnetic substrate of magnetic properties and
surface roughness should be similar to the magnetic properties and
surface roughness of specimens substrate.
For eddy current method, the standard substrate of electrical
properties should be similar to the electrical properties of
specimens substrate.
b) The thickness of substrate
Check whether the thickness of the substrate is lower than the
minimum thickness, if not, can use one of method in 3.3 to
calibrate.
c) Edge effect
Should not be in the specimen shape changing places, such as edges,
holes, and the place such as Angle measurement.
d) The curvature
Should not be in curved surface measurement of the specimens.
e) Measurement and measured times
Usually as a result of the instrument measurement result is not the
same each time, so we must in every area from several measurement
results.Coating thickness and surface rough degree of local
differences, require at any repeated measurements in a specific
area.
f)Surface cleanliness
Before measurement, should remove any attached on the surface of a
material, such as dust, grease and corrosion products, but do not
remove any covering material.
High quality Equipment Box:
Non Ferrous Probe Film Thickness Tester With Limit Setting Function
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