IEC 61032 Test Probe B
Brand Name:HeJin
Certification:calibration certificate (cost additional)
Model Number:HT-I02
Minimum Order Quantity:1 set
Delivery Time:3 days
Payment Terms:L/C, T/T
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Location:
Guangzhou Guangdong China
Address:
No.6-36, Yaogu Farm, Shibi No.3 Village, Shibi Street, Panyu District, Guangzhou, Guangdong, China
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Product Details
IEC61032 Test Finger Probe Figure 2 Test Probe B 80mm Finger Length
Standard:
IEC 61032 ‘Protection of persons and equipment by enclosures – Probes for verification’ figure 2 test probe B.
IEC 60529 Degrees of protection provided by enclosures (IP Code) IP2X
IEC 60335-1 ‘Household and similar electrical appliances – Safety – Part 1: General requirements’
Application:
This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.
Access probes of IEC 60529 (IP code) to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.
Feature:
It has two movable joints, which can be curved at 90°. Can be used with a electrical indicator.
A hole (M6) can be made at the end of the handle for connection with a push-pull gauge. The model with ‘T’ means that this model is with force.
Parameter:
| Model | HT-I02 | HT-I02A | HT-I02B | HT-I02T |
| Name | Standard Test Finger Test Finger Probe | Circular Baffle Test finger | Large Baffle Test Finger | Standard Test Finger With Force |
| Joint 1 | 30±0.2 | 30±0.2 | 30±0.2 | 30±0.2 |
| Joint 2 | 60±0.2 | 60±0.2 | 60±0.2 | 60±0.2 |
| Finger length | 80±0.2 | 80±0.2 | 100±0.2 | 80±0.2 |
| Fingertip to baffle | 180±0.2 | 180±0.2 | ---- | 180±0.2 |
| Cylindrical | R2±0.05 | R2±0.05 | R2±0.05 | R2±0.05 |
| Spherical | R4±0.05 | R4±0.05 | R4±0.05 | R4±0.05 |
| Fingertip cutting bevel angle | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ |
| Fingertip taper | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ |
| Test finger diameter | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 |
| A-A Section diameter | Ф50 | Ф50 | ---- | Ф50 |
| A-A Section width | 20±0.2 | ---- | ---- | 20±0.2 |
| Baffle diameter | Ф75±0.2 | Ф75±0.2 | Ф125±0.2 | Ф75±0.2 |
| Baffle thickness | 5±0.5 | 5±0.5 | ---- | 5±0.5 |
| Force | ---- | ---- | ---- | With force 0-50N |
| Applied standard | IEC61032-1 | IEC60335-1 | IEC60335-2-14 | IEC60529-1 |
IEC 61032 Test Probe B
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