4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials

Brand Name:PAM-XIAMEN
Minimum Order Quantity:1-10,000pcs
Delivery Time:5-50 working days
Payment Terms:T/T
Place of Origin:China
Price:By Case
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Location: Xiamen Fujian China
Address: #506B, Henghui Business Center, No.77, Lingxia Nan Road, High Technology Zone, Huli, Xiamen 361006, China
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4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials


PAM-XIAMEN has established the manufacturing technology for freestanding (Gallium Nitride)GaN substrate wafer which is for UHB-LED and LD. Grown by hydride vapour phase epitaxy (HVPE) technology,Our GaN substrate has low defect density and less or free macro defect density.


PAM-XIAMEN offers full range of GaN and Related III-N Materials including GaN substrates of various orientations and electrical conductivity,crystallineGaN&AlN templates, and custom III-N epiwafers.


Here Shows Detail Specification:

4inch Freestanding GaN Substrates

ItemPAM-FS-GaN100-U
DimensionΦ100mm ±1mm
Thickness500-650 µm
Useable Surface Area> 90%
OrientationC-plane(0001)
Orientation Flat(1-100) ±0.50,30±1mm
Secondary Orientation Flat(11-20)±30,15±1mm
TTV(Total Thickness Variation)≤50µm
Conduction TypeUndoped
Resistivity (300K)< 0.5 Ω·cm
Dislocation DensityLess than 5x106cm-2
Surface Roughness:

Front side: Ra<0.2nm, epi-ready;

Back side: Fine Ground or polished.

Packageeach in single wafer container, under nitrogen atmosphere, packed in class 100 clean room

4inch Freestanding GaN Substrates

The growing demand for high-speed, high-temperature and high power-handling capabilities has made the semiconductor industry rethink the choice of materials used as semiconductors. For instance, as various faster and smaller computing devices arise, the use of silicon is making it difficult to sustain Moore’s Law. But also in power electronics, the properties of silicon are no longer sufficient to allow further improvements in conversion efficiency.


Due to its unique characteristics (high maximum current, high breakdown voltage, and high switching frequency), Gallium Nitride (or GaN) is the unique material of choice to solve energy problems of the future. GaN based systems have higher power efficiency, thus reducing power losses, switch at higher frequency, thus reducing size and weight.


Zinc Blende crystal structure

RemarksReferens
Energy gaps, Eg3.28 eV0 KBougrov et al. (2001)
Energy gaps, Eg3.2 eV300 K
Electron affinity4.1 eV300 K
Conduction band
Energy separation between Γ valley and X valleys EΓ1.4 eV300 KBougrov et al. (2001)
Energy separation between Γ valley and L valleys EL1.6 ÷ 1.9 eV300 K
Effective conduction band density of states1.2 x 1018 cm-3300 K
Valence band
Energy of spin-orbital splitting Eso0.02 eV300 K
Effective valence band density of states4.1 x 1019 cm-3300 K

Band structure for Zinc Blende GaN

Band structure of zinc blende(cubic) GaN. Important minima of the conduction band and maxima of the valence band.
300K; Eg=3.2 eVeV; EX= 4.6 eV; EL= 4.8-5.1 eV; Eso = 0.02 eV
For details see Suzuki, Uenoyama & Yanase (1995) .


Brillouin zone of the face centered cubic lattice, the Bravais lattice of the diamond and zincblende structures.

China 4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials supplier

4 Inch Freestanding GaN Substrates As III-Nitride Semiconductor Materials

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