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Ce YAP Scintillation Detector
Description
Yttrium aluminum perovskite activated by cerium is a fast(28 ns decay time), mechanically and chemically resistant scintillation material. These scintillators have very low energy secondary X-ray emission, which is of advantage in imaging applications. YAP:Ce detectors are used for gamma and X-ray counting, electron microscopy, electron and X-ray imaging screens. The materials scintillation and mechanical properties enable their use in tomography systems.
Features
Applications
Physical and Chemical Properties
Property | Ce:YAP |
Chemical composition | YAlO3 |
Melting(℃) | 1875℃ |
Crystal structure | Rhombic |
Structure | Pnma |
Cell parameters() | (a)5.329 |
Hardness | 8.6 |
Density(g/cm3) | 5.37 |
Thermal conductivity(W/℃cm,25℃) | 0.11 |
expanding coefficient(10-6/℃) | (a)4.2 |
Refractive index(=1.079m) | (na)1.931 |
Scintillation properties
Emission peak (nm) | 360 |
Light yield (PhotonsMev-1) | 25000 |
Relative light output(%NaI:Tl) | 40 |
Decay time(ns) | 25-38 |
Energy resolution | <5% |
Zeff | 40 |
Afterglow(% after 6ms) | <0.005 |
Polishing Specifications
Polishing Specification for Laser Grade | |
Orientation Tolerence | <0.5° |
Thickness/Diameter Tolerance | ±0.05 mm |
Parallel | 10’’ |
Perpendicular | 5’ |
surface Quality | 10/5 |
Clear Aperture | >90% |
Chamfer | <0.2×45° |
Maximum dimensions | Dia55mm |
Standard product
Dimensions,mm | Decaytime, ns | Lightyeild, photons/Mev | RefractiveIndex |
5×5×0.5 | <40 | 25000 | 1.91 - 1.93 |
5×5×1 | |||
10×5×0.5 | |||
10×5×1 | |||
10×10×0.5 | |||
10×10×1 | |||
25×25×0.5 | |||
25×25×1 | |||
dia5×0.5 | |||
dia5×1 |