... optic Product Description optic can check out depression , scratches, contamina...
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... Descriptions This produces a high-quality, low-distortion image of both the connector end a...
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... Optic 200X For Terminations Detailed Product Description: The Mini s are used for inspecting fibe...
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... For 1.25 / 2.5mm Connector With 2.5mm & 1.25mm Adapters for LC & SC & ST & FC Connectors, OMC’s Optic Inspe...
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... conditions on FC / SC / LC optic jumpers/pigtail quickly, the image of end is very clear, it is applied to optical communication...
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... optic with video display Optic Tools and Test Equipment Model:400X-FV Place of Origin:Guangdong,China Description...
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Optic / Integrated End Face Detector optic inspector The 400X s are used for termination...
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... the sample perpendicular to the end-face. It produces excellent detail of scratches and contamination. For critical examination of polish qu...
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100v To 240v Gem Jewelers For Jewelry Model Number: FGM-U2-19 Specifications: Technical Parameter Eyepiece WF10/16mm ...
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... tool in their jobs. A24.0402 gemological is especially designed to view precious stone samples and the pieces of jewelry that contain t...
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... VM-660 Application field: Product , material and research, PCB and SMT and analysis, printing, textile i...
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... Optical Connector Cleaner Quick Details Brand Name: DYS Model Number:Axial Adjustment Type Vide Insertion Loss≦0.2dB Insert...
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...
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97mm WD Wide Field Stereo Zoom Microscope Trinocular Industrial Inspection NCS-400 Description: · High quality, high function and excellent cost perfo...
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... and the profiled can be observed. The longitudinal and cross-sectional images of are collected by digital cameras. With ...
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... USB with stand Main parameters: Interface: USB input Pixels: 2 million (2MP) Multiple: 1-600 times Self illuminating light: 6...
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400 Measuring Metallurgical for Wafer Usage series measuring metallurgical are widely used in semiconduct...
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Toolmaker Measuring Microscope/industry Measuring Microscope VMT-4030 Product Description Functions 1.Bright-field view if the investigation,WM- 3D po...
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